Two effective methods for improving the quality of THz spectroscopy systems

The factors affecting the quality of material identification by simulating a simple THz spectroscopy system in the frequency range of 0.5–1 THz, have been investigated. Two methods, using the Kramers-Kronig relation and the derivative of the reflection coefficient, are applied to identify the C-4 material. Also, the optimal incident angle to minimize the sensitivity of the reflectance to the incident angle has been obtained theoretically. To improve the THz spectroscopy of rough objects, two methods are proposed including transmitter displacement and rotation. Using the relations between the scattered waves and the spatial frequencies, the proposed methods are theoretically analyzed and their advantages, problems, and limitations are pointed out. Our simulation results on different rough surfaces approves the effectiveness of the proposed methods.