Estimation of lunar surface roughness using Chandrayaan-2 full-polarimetric DFSAR data

Polarimetric radar backscattering coefficients depend on the impinging frequency, dielectric constant, incidence angle, polarization, and surface roughness. Therefore, surface roughness can be estimated using high-resolution polarimetric radar datasets. For this purpose, we examine the utility of model-based and eigenvalue-based decomposition approaches in this work. While using model-based decomposition, the dielectric constant is estimated at the outset. Thereafter, the rms height is derived from a scalar multiplier that models surface roughness. We also propose a modified single-bounce eigenvalue relative difference (SERD) and establish that it is a better indicator of surface roughness than the circular polarization coherence and the original SERD for non-reflection-symmetric lunar terrain. The Chandrayaan-2 Dual Frequency Synthetic Aperture Radar (DFSAR) datasets acquired over three Apollo mission landing sites are used for demonstration. •Estimation of lunar surface roughness at cm scales from Chandrayaan-2 data.•RMS height estimated using model-based decomposition approach.•Also proposed a modified SERD parameter as a descriptor of lunar surface roughness•Modified SERD found superior to circular polarization coherence and original SERD•Useful study for identifying optimal landing sites for future lunar missions