Exploring bipolar resistive switching behavior of sprayed BaTiO3 thin films for nonvolatile memory application

The memristive properties of barium titanate (BT) thin films deposited by cost-effective spray pyrolysis technique are explored. The device was configured as Ag/BT/FTO. The electrical measurements unveiled robust bipolar resistive switching (BRS) characteristics in the devices with memory window ∼35. This behavior, attributed to intrinsic defects within BaTiO3, demonstrated the potential of these films for applications in advanced electronic devices like Resistive-Random Access Memory (RRAM). The observed phenomenon arises from the generation of polarized areas within the material, responsive to an applied electric field. Specifically focusing on the memristive aspects, this study indicated promising non-volatile memory performance. All devices undergo the SET process between 0.9 and 1.7 V, and the RESET process takes place between −1.3 to −1.9 V. According to the statistical distribution of SET and RESET voltages, the coefficient of variation (CV) for all devices is less than 18 %. The Ag/BT/FTO memristive device exhibited endurance through 103 cycles of switching, attesting to its reliability. Moreover, the device displayed the capability to maintain stored data for 104 seconds. This establishes the suitability of spray-deposited BaTiO3 thin films for memory-based applications. [Display omitted] •BaTiO3 thin films were synthesized by spray pyrolysis technique.•Ag/BT/FTO device shows digital type bipolar resistive switching.•The optimized Ag/BT-325/FTO device shows good non-volatile memory property.•Statistical analysis suggests the good operational uniformity of all devices.