An ultra-low quiescent current power-on reset circuit with DDPG method

An ultra-low quiescent current power-on reset (POR) circuit with double-delay pulse generation (DDPG) method is presented in this paper. The circuit is designed for non-volatile memory (NVM) systems, aiming to ensure reliable initialization and enhance overall efficiency. To address the challenge of...

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Veröffentlicht in:International journal of electronics and communications 2024-02, Vol.175, p.155097, Article 155097
Hauptverfasser: He, Luchang, Wu, Qingyu, Xie, Chenchen, Li, Xi, Song, Zhitang
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Sprache:eng
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Zusammenfassung:An ultra-low quiescent current power-on reset (POR) circuit with double-delay pulse generation (DDPG) method is presented in this paper. The circuit is designed for non-volatile memory (NVM) systems, aiming to ensure reliable initialization and enhance overall efficiency. To address the challenge of inaccurate trigger-point voltage caused by process, voltage, temperature (PVT) and ramp time variations, a novel pulse generation method is proposed. Additionally, the circuit further improves the reliability of pulse duration through the utilization of low-cost current reference generators. Implemented in standard 40 nm CMOS technology, the delay-based POR circuit consumes only 0.24 nA quiescent current and occupies a compact area of 25.6μm×102μm. The simulation results demonstrate a typical pulse duration time of 28μs, with a temperature coefficient (TC) of 101.4 ppm/°C. The high reliability and low overhead of this circuit make it suitable for NVM systems and other fast power-on applications. •We introduce a DDPG method to avoid the effects of inaccurate trigger point voltage and supply ramp time.•We employ a low-cost current reference generator to realize reliable reset pulse duration.•Quiescent current is effectively reduced by turning off the circuit after generating an output pulse.•Delay-based architecture enables a compact circuit layout.•Our design is suitable for non-volatile memory systems and other fast power-on applications.
ISSN:1434-8411
1618-0399
DOI:10.1016/j.aeue.2023.155097