Electrical Resistivity in Non-stoichiometric MoO2

MoO y with 1.85 ≤  y  ≤ 2.20 has been studied by X-ray diffractometry and photoemission spectroscopy at room temperature and by electrical resistance as a function of temperature from 2 to 300 K. Although X-ray diffractograms are very similar to the stoichiometric MoO 2 with monoclinic structure of...

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Veröffentlicht in:Brazilian journal of physics 2015-04, Vol.45 (2), p.234-237
Hauptverfasser: Alves, L. M. S., Benaion, S. S., Romanelli, C. M., dos Santos, C. A. M., da Luz, M. S., de Lima, B. S., Oliveira, F. S., Machado, A. J. S., Guedes, E. B., Abbate, M., Mossanek, R. J. O.
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Sprache:eng
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Zusammenfassung:MoO y with 1.85 ≤  y  ≤ 2.20 has been studied by X-ray diffractometry and photoemission spectroscopy at room temperature and by electrical resistance as a function of temperature from 2 to 300 K. Although X-ray diffractograms are very similar to the stoichiometric MoO 2 with monoclinic structure of the space group P2 1 /c (14), the electrical properties are strongly dependent on the oxygen composition. Samples with y  = 1.85 and 1.90 show anomalous behavior in electrical conductivity. Photoemission and X-ray absorption spectroscopy measurements suggest that this anomalous behavior is related to the presence of Mo 3+ ions such as in K x MoO 2   compound.
ISSN:0103-9733
1678-4448
DOI:10.1007/s13538-015-0307-1