Microstructural and morphological insight of wide band gap SnO2 towards gas sensor applications

Wide band gap tin oxide (SnO 2 ) nanostructures have been synthesized by simple chemical method. Powder X-ray diffraction (PXRD), UV-Visible spectrophotometry (UV-Vis), Fourier transform infrared spectroscopy (FTIR), scanning electron microscopy (SEM), and energy dispersive X-ray spectroscopy (EDAX) were used for analysis. XRD Powder profile refinement authenticates that prepared SnO 2 sample has been crystallized in a tetragonal form. Cell constants, average grain size, dislocation density, number of unit cell, morphology index and microstrain are also calculated from XRD data. Optical band gap (E g ) value is estimated from UV-Vis analysis as 3.87 eV. The existence of the most important functional groups during the steps involved in the synthesis is examined in view of the results obtained from FTIR spectrum. Atomic and weight percentages of the elements Sn and O are confirmed from EDAX spectrum. Surface morphology is analyzed from SEM micrograph and the surface feature confirms that SnO 2 is potential candidate for gas sensor applications.