Traces of Thermoelectric Properties on XAFS Spectra

In this study, a theoretical approach to the thermoelectric properties of popular thermoelectric materials, Bi 2 Te 3 , Bi 2 Se 3 , CuAlS 2 , Cu 12 Sb 4 S 13 , was made by x-ray absorption fine structure (XAFS) calculations. The traces of thermoelectric properties were studied by means of the electronic scattering mechanisms by the repulsive force of outer-shell electrons on the photoelectrons emitted by excited atoms. The deterioration in scattering densities is thought to be indirectly related to thermoelectric conversion power, and the analysis of the studied materials revealed much interesting data confirming the relationship of the thermoelectric properties of the materials with the decrease in the number of electrons in the outer-shell electrons that are actively involved in the scattering mechanisms. The results of the study have shown a high agreement with the thermoelectric properties of the studied materials, as reported in the literature. Graphical Abstract Fourier Transform of the EXAFS scattering data of materials: a Bi2Se3 b Bi2Te3 c Cu12Sb4S13 d CuAlS