Effect of Ni on the Formation and Growth of Primary Cu6Sn5 Intermetallics in Sn-0.7 wt.%Cu Solder Pastes on Cu Substrates During the Soldering Process
This paper investigates the effect of 0.05 wt.% Ni on the formation and growth of primary Cu 6 Sn 5 in Sn-0.7 wt.%Cu solder paste soldered on a Cu substrate, using a real-time synchrotron imaging technique. It was found that small additions of Ni significantly alter the formation and growth of the p...
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Veröffentlicht in: | Journal of electronic materials 2016-01, Vol.45 (1), p.154-163 |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | This paper investigates the effect of 0.05 wt.% Ni on the formation and growth of primary Cu
6
Sn
5
in Sn-0.7 wt.%Cu solder paste soldered on a Cu substrate, using a real-time synchrotron imaging technique. It was found that small additions of Ni significantly alter the formation and growth of the primary Cu
6
Sn
5
intermetallics, making them small. In contrast, without Ni, primary Cu
6
Sn
5
intermetallics tend to continue growth throughout solidification and end up much larger and coarser. The primary effect of the Ni addition appears to be in promoting the nucleation of a larger amount of small Cu
6
Sn
5
. The results provide direct evidence of the sequence of events in the reaction of Ni-containing Sn-0.7 wt.%Cu solder paste with a Cu substrate, and in particular the formation and growth of the primary Cu
6
Sn
5
intermetallic. |
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ISSN: | 0361-5235 1543-186X |
DOI: | 10.1007/s11664-015-4121-x |