Operation methods of resistive random access memory

In this paper, different electrical measurement and operation methods of resistive random access memory (RRAM) have been summarized, including voltage sweeping mode (VSM), current sweeping mode (CSM), constant current stress (CCS), constant voltage stress (CVS), rectangular pulse mode (RPM), and tri...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Science China. Technological sciences 2014-12, Vol.57 (12), p.2295-2304
Hauptverfasser: Wang, GuoMing, Long, ShiBing, Zhang, MeiYun, Li, Yang, Xu, XiaoXin, Liu, HongTao, Wang, Ming, Sun, PengXiao, Sun, HaiTao, Liu, Qi, Lü, HangBing, Yang, BaoHe, Liu, Ming
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this paper, different electrical measurement and operation methods of resistive random access memory (RRAM) have been summarized, including voltage sweeping mode (VSM), current sweeping mode (CSM), constant current stress (CCS), constant voltage stress (CVS), rectangular pulse mode (RPM), and triangle pulse mode (TPM). Meanwhile, the effects of these measurement methods on the forming, set, reset and read operation as well as endurance performance have been compared. Finally, their respective controllability of various resistive switching parameters have been summarized and analyzed.
ISSN:1674-7321
1869-1900
DOI:10.1007/s11431-014-5718-7