Analytical method for the analysis of thin SiGe/Si solar cells with front surface field

The present paper reports on a simulation study carried out to determine and optimize the effect of the high-low junction emitter (n + /n) of thin film SiGe/Si solar cell. The model is based on a simple analytical approach that draws on relevant device physics, including effective surface recombinat...

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Veröffentlicht in:Optical and quantum electronics 2016-05, Vol.48 (5), Article 305
Hauptverfasser: Kadri, Emna, Krichen, Monem, Arab, Adel Ben
Format: Artikel
Sprache:eng
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Zusammenfassung:The present paper reports on a simulation study carried out to determine and optimize the effect of the high-low junction emitter (n + /n) of thin film SiGe/Si solar cell. The model is based on a simple analytical approach that draws on relevant device physics, including effective surface recombination velocity at the high-low junction and band discontinuities associated with heterojunctions. The collection of the light absorbed by the front surface field is discussed and an analytical solution is derived for the light-generated current in this layer. The photovoltaic parameters of SiGe/Si solar cells and those of the conventional cell Si/Si are compared. The findings revealed that the addition of Ge ~15 % to crystal Si highly enhances short-circuit current density and cell efficiency, whereas the SiGe band-gap degrades particularly the open-circuit voltage. The results also indicate that the solar cell maximum efficiency increase by about 1.7 % when the interface state density is lower than 10 11  cm −2 .
ISSN:0306-8919
1572-817X
DOI:10.1007/s11082-016-0574-2