Analytical method for the analysis of thin SiGe/Si solar cells with front surface field
The present paper reports on a simulation study carried out to determine and optimize the effect of the high-low junction emitter (n + /n) of thin film SiGe/Si solar cell. The model is based on a simple analytical approach that draws on relevant device physics, including effective surface recombinat...
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Veröffentlicht in: | Optical and quantum electronics 2016-05, Vol.48 (5), Article 305 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The present paper reports on a simulation study carried out to determine and optimize the effect of the high-low junction emitter (n
+
/n) of thin film SiGe/Si solar cell. The model is based on a simple analytical approach that draws on relevant device physics, including effective surface recombination velocity at the high-low junction and band discontinuities associated with heterojunctions. The collection of the light absorbed by the front surface field is discussed and an analytical solution is derived for the light-generated current in this layer. The photovoltaic parameters of SiGe/Si solar cells and those of the conventional cell Si/Si are compared. The findings revealed that the addition of Ge ~15 % to crystal Si highly enhances short-circuit current density and cell efficiency, whereas the SiGe band-gap degrades particularly the open-circuit voltage. The results also indicate that the solar cell maximum efficiency increase by about 1.7 % when the interface state density is lower than 10
11
cm
−2
. |
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ISSN: | 0306-8919 1572-817X |
DOI: | 10.1007/s11082-016-0574-2 |