Microstructure and microwave dielectric properties of xSm(Mg0.5Ti0.5)O3–(1 − x)Ca0.8Sr0.2TiO3 ceramics

xSm(Mg 0.5 Ti 0.5 )O 3 –(1 − x)Ca 0.8 Sr 0.2 TiO 3 (x = 0.50–0.95) ceramics are prepared by a conventional solid-state ceramic route. The microstructure and microwave dielectric properties are investigated as a function of the x-value and sintering temperature. The single phase solid solutions were...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2014-09, Vol.25 (9), p.4046-4050
Hauptverfasser: Yao, Lichun, Qiu, Tai, Wan, Wei, Yang, Jian
Format: Artikel
Sprache:eng
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Zusammenfassung:xSm(Mg 0.5 Ti 0.5 )O 3 –(1 − x)Ca 0.8 Sr 0.2 TiO 3 (x = 0.50–0.95) ceramics are prepared by a conventional solid-state ceramic route. The microstructure and microwave dielectric properties are investigated as a function of the x-value and sintering temperature. The single phase solid solutions were obtained throughout the studied compositional range. The variation of bulk density and dielectric properties are related with the x-value. Increasing sintering temperature can effectively promote the densification and dielectric properties of xSm(Mg 0.5 Ti 0.5 )O 3 –(1 − x)Ca 0.8 Sr 0.2 TiO 3 ceramic system. With the content of Sm(Mg 0.5 Ti 0.5 )O 3 increasing, the temperature coefficient of resonant frequency τ f value decreased, and a near-zero τ f could be obtained for the samples with x = 0.80. The optimal microwave dielectric properties with a dielectric constant ε r of 30.1, Q  ×  f of 115,000 GHz (at 8.0 GHz), and τ f of 8.9 ppm/°C were obtained for 0.80Sm(Mg 0.5 Ti 0.5 )O 3 –0.20Ca 0.8 Sr 0.2 TiO 3 sintered at 1,550 °C for 3 h, which showed high density and well-developed grain growth.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-014-2127-4