Microstructure and microwave dielectric properties of xSm(Mg0.5Ti0.5)O3–(1 − x)Ca0.8Sr0.2TiO3 ceramics
xSm(Mg 0.5 Ti 0.5 )O 3 –(1 − x)Ca 0.8 Sr 0.2 TiO 3 (x = 0.50–0.95) ceramics are prepared by a conventional solid-state ceramic route. The microstructure and microwave dielectric properties are investigated as a function of the x-value and sintering temperature. The single phase solid solutions were...
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Veröffentlicht in: | Journal of materials science. Materials in electronics 2014-09, Vol.25 (9), p.4046-4050 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
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Zusammenfassung: | xSm(Mg
0.5
Ti
0.5
)O
3
–(1 − x)Ca
0.8
Sr
0.2
TiO
3
(x = 0.50–0.95) ceramics are prepared by a conventional solid-state ceramic route. The microstructure and microwave dielectric properties are investigated as a function of the x-value and sintering temperature. The single phase solid solutions were obtained throughout the studied compositional range. The variation of bulk density and dielectric properties are related with the x-value. Increasing sintering temperature can effectively promote the densification and dielectric properties of xSm(Mg
0.5
Ti
0.5
)O
3
–(1 − x)Ca
0.8
Sr
0.2
TiO
3
ceramic system. With the content of Sm(Mg
0.5
Ti
0.5
)O
3
increasing, the temperature coefficient of resonant frequency τ
f
value decreased, and a near-zero τ
f
could be obtained for the samples with x = 0.80. The optimal microwave dielectric properties with a dielectric constant
ε
r
of 30.1,
Q
×
f
of 115,000 GHz (at 8.0 GHz), and
τ
f
of 8.9 ppm/°C were obtained for 0.80Sm(Mg
0.5
Ti
0.5
)O
3
–0.20Ca
0.8
Sr
0.2
TiO
3
sintered at 1,550 °C for 3 h, which showed high density and well-developed grain growth. |
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ISSN: | 0957-4522 1573-482X |
DOI: | 10.1007/s10854-014-2127-4 |