Deactivation of poly(o-aminophenol) film electrodes by storage without use in the supporting electrolyte solution and its comparison with other deactivation processes. A study employing EIS
The effect of storage time without use (STWU) in the supporting electrolyte solution on the charge-transport parameters of poly( o -aminophenol) (POAP) film electrodes was studied by electrochemical impedance spectroscopy. STWU decreases the charge-transport rate of the polymer. This effect is herei...
Gespeichert in:
Veröffentlicht in: | Journal of applied electrochemistry 2015-10, Vol.45 (10), p.1123-1132 |
---|---|
1. Verfasser: | |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The effect of storage time without use (STWU) in the supporting electrolyte solution on the charge-transport parameters of poly(
o
-aminophenol) (POAP) film electrodes was studied by electrochemical impedance spectroscopy. STWU decreases the charge-transport rate of the polymer. This effect is herein called deactivation. Impedance diagrams of both nondeactivated and deactivated films in contact with a solution containing the
p
-benzoquinone/hydroquinone redox couple were interpreted on the basis of a model formulated for homogeneous conducting polymers, where the bathing electrolyte contains a redox pair that provides the possibility for electrons to leak from the film surface. Dependences of diffusion coefficients for electron (
D
e
) and ion (
D
i
) transport and interfacial resistances related to ion
R
i
f
|
s
and electron
R
m
|
f
,
R
e
f
|
s
transfer across the polymer/solution and metal/polymer interfaces, respectively, on the degree of deactivation (
θ
d
) of the polymer were obtained. These dependences were compared with those from previous work for POAP films deactivated by employing other procedures, such as high positive potential limits, soaking in a ferric ion solution, and prolonged potential cycling. |
---|---|
ISSN: | 0021-891X 1572-8838 |
DOI: | 10.1007/s10800-015-0851-y |