Correction to: Statistical and interferometric determination of the optical thickness of a multilayer transparent plate

Correction to: Statistical and interferometric determination of the optical thickness of a multilayer transparent plate

In the original publication Acknowledgements was not included. The Acknowledgements is given in this correction.

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Veröffentlicht in:Optical review (Tokyo, Japan) Japan), 2019-02, Vol.26 (1), p.143-143
Hauptverfasser: Kim, Yangjin, Hibino, Kenichi
Format: Artikel
Sprache:eng
Schlagworte:
Atomic
Correction
Lasers
Microwaves
Molecular
Optical and Plasma Physics
Optical Devices
Optics
Photonics
Physics
Physics and Astronomy
Quantum Optics
RF and Optical Engineering
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Zusammenfassung:In the original publication Acknowledgements was not included. The Acknowledgements is given in this correction.
ISSN:1340-6000
1349-9432
DOI:10.1007/s10043-018-0484-6