Extraction of admittance parameters of symmetrically doped AlGaN/GaN/AlGaN DH-HEMT for microwave frequency applications
An analytical model for determining intrinsic short-circuit admittance (Y) parameters of AlGaN/GaN/AlGaN Double Heterostructure (DH) High Electron Mobility Transistor (HEMT) is presented. These Y parameters obtained in terms of the various small signal equivalent circuit parameters are in turn used...
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Veröffentlicht in: | Microsystem technologies : sensors, actuators, systems integration actuators, systems integration, 2021-11, Vol.27 (11), p.4065-4072 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | An analytical model for determining intrinsic short-circuit admittance (Y) parameters of AlGaN/GaN/AlGaN Double Heterostructure (DH) High Electron Mobility Transistor (HEMT) is presented. These Y parameters obtained in terms of the various small signal equivalent circuit parameters are in turn used to evaluate the enhanced microwave performance of the DH-HEMT in terms of various parameters including Unilateral Power Gain and maximum oscillation frequency. The cut-off frequency has been evaluated from short circuit current gain. The cut-off frequency (f
T
) and maximum oscillation frequency (f
max
) exhibited for DH-HEMT is 125 GHz and 215 GHz which is comparatively improved as obtained in Single Heterostructure (SH) HEMT (f
T
= 105 GHz and f
max
= 165 GHz). The analytical results obtained for DH and SH-HEMT; have been compared and found to match well with the ATLAS 2D device simulation results thus proving the validity of the model. |
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ISSN: | 0946-7076 1432-1858 |
DOI: | 10.1007/s00542-020-04805-w |