Conductivity and dielectric studies on K2SrP2O7 compound
K 2 SrP 2 O 7 compound was prepared by the solid-state reaction method and characterized through XRD and Raman spectroscopy techniques. The impedance spectroscopy measurements were performed in the frequency and the temperature range of (209 Hz–1 MHz) and (613–676 K), respectively. Besides, the impe...
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Veröffentlicht in: | Applied physics. A, Materials science & processing Materials science & processing, 2015-06, Vol.119 (3), p.1119-1125 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
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Zusammenfassung: | K
2
SrP
2
O
7
compound was prepared by the solid-state reaction method and characterized through XRD and Raman spectroscopy techniques. The impedance spectroscopy measurements were performed in the frequency and the temperature range of (209 Hz–1 MHz) and (613–676 K), respectively. Besides, the impedance spectra were fitted to an equivalent circuit consisting of series combination of grains and grain boundary. Dielectric data were analyzed using complex electrical modulus
M
∗
at various temperatures. The modulus plots are characterized by the presence of two relaxation peaks thermally activated. The AC conductivity for grain contribution is interpreted using the universal Jonscher’s power law. The values of the activation energy deduced from the DC conductivity (0.68 eV), modulus (0.74 eV) and hopping frequency (0.64 eV) confirm that the transport is through ion hopping mechanism. |
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ISSN: | 0947-8396 1432-0630 |
DOI: | 10.1007/s00339-015-9077-4 |