Preparation and probe analysis of Langmuir–Blodgett films with metal-containing dendritic and cluster structures

We aim to reveal the influence of pH values of the working solution on spatial arrangement of metal-containing inclusions in the monolayer coatings prepared by Langmuir–Blodgett (LB) technology and transferred to solid substrates with consequent modification of surface electrical properties. Consequently, films with inclusions in the form of dendrites and cluster shapes have been obtained. Submicron and micron lead-containing formations in Langmuir–Blodgett films have been characterized by using the atomic force microscopy, Kelvin probe microscopy, and scanning electron microscopy methods. The results show that increasing pH value of the subphase has caused the significant changes in the shape and composition of the inclusions in Langmuir–Blodgett films. The synthesized inclusions on the solid substrate surface resulted in formation of the regions with the local electric fields and, as consequence, to significant modification of the structure and electrical properties. The location and length of the regions with surface potential disturbance depend on the shape of inclusions, and consequently, on pH value of the subphase used in LB technology.