Magnetization reversal studies of continuous and patterned exchange biased NiFe/FeMn thin films

In this article we present a detailed investigation of the structural and magnetic properties of exchange biased NiFe (ferromagnet)/FeMn (antiferromagnet) thin films. The influence of the shape anisotropy on exchange bias and the magnetization reversal mechanism in a sample with patterned lines is c...

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Veröffentlicht in:Applied physics. A, Materials science & processing Materials science & processing, 2012-10, Vol.109 (1), p.181-187
Hauptverfasser: Mohanty, J., Vandezande, S., Brems, S., Van Bael, M. J., Charlton, T., Langridge, S., Dalgliesh, R. M., Temst, K., Van Haesendonck, C.
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Sprache:eng
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Zusammenfassung:In this article we present a detailed investigation of the structural and magnetic properties of exchange biased NiFe (ferromagnet)/FeMn (antiferromagnet) thin films. The influence of the shape anisotropy on exchange bias and the magnetization reversal mechanism in a sample with patterned lines is compared with a continuous two-dimensional reference sample. Polarized neutron reflectivity (PNR) is employed to study the magnetization reversal by analyzing the spin-flip and non-spin-flip reflectivities. PNR measurements show that the magnetization reversal in the reference two-dimensional film and patterned lines is by domain wall motion rather than coherent rotation of magnetization.
ISSN:0947-8396
1432-0630
DOI:10.1007/s00339-012-7031-2