Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples

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Bibliographische Detailangaben
Veröffentlicht in:	Applied physics. A, Materials science & processing Materials science & processing, 1999-12, Vol.69 (6), p.581-589
Hauptverfasser:	FERBER, J, FISCHER, U. C, HAGEDORN, N, FUCHS, H
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Instruments, apparatus, components and techniques common to several branches of physics and astronomy Metals. Metallurgy Physics Scanning probe microscopes, components and techniques Scanning tunneling microscopes Solid surfaces and solid-solid interfaces Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Online-Zugang:	Volltext
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