Recoil spectrometry : ion accelerator based elemental characterisation of surface layers
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| Veröffentlicht in: | Mikrochimica acta (1966) 1995-03, Vol.120 (1-4), p.171-181 |
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| container_end_page | 181 |
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| container_issue | 1-4 |
| container_start_page | 171 |
| container_title | Mikrochimica acta (1966) |
| container_volume | 120 |
| creator | WHITLOW, H. J ANDERSSON, M JOHNSTON, P. N BUBB, I. F WALKER, S. R JOHANSON, E HOGMARK, S INGEMARSSON, P. A HULT, M PERSSON, L MOHAMED EL BOUANANI ÖSTLING, M ZARING, C LUNDBERG, N COHEN, D. D DYTLEWSKI, N |
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| doi_str_mv | 10.1007/BF01244430 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0026-3672 |
| ispartof | Mikrochimica acta (1966), 1995-03, Vol.120 (1-4), p.171-181 |
| issn | 0026-3672 1436-5073 |
| language | eng |
| recordid | cdi_crossref_primary_10_1007_BF01244430 |
| source | SpringerLink Journals - AutoHoldings |
| subjects | Analytical chemistry Chemistry Exact sciences and technology Spectrometric and optical methods |
| title | Recoil spectrometry : ion accelerator based elemental characterisation of surface layers |
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