Ionic processes in dielectric layers on silicon surface and their effect on electrophysical properties of silicon-dielectric boundary
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| Veröffentlicht in: | Soviet Physics Journal 1977-09, Vol.20 (9), p.1156-1159 |
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| Sprache: | eng |
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| container_end_page | 1159 |
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| container_issue | 9 |
| container_start_page | 1156 |
| container_title | Soviet Physics Journal |
| container_volume | 20 |
| creator | Tarantov, Yu. A. Kas'yanenko, E. V. Konorov, P. P. Bulavinov, V. V. |
| description | |
| doi_str_mv | 10.1007/BF00897119 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0038-5697 |
| ispartof | Soviet Physics Journal, 1977-09, Vol.20 (9), p.1156-1159 |
| issn | 0038-5697 1573-9228 |
| language | eng |
| recordid | cdi_crossref_primary_10_1007_BF00897119 |
| source | SpringerNature Complete Journals |
| title | Ionic processes in dielectric layers on silicon surface and their effect on electrophysical properties of silicon-dielectric boundary |
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