Photometric method of determining gold film thickness of nuclear radiation silicon detectors

The authors examine a photometric method of assessing a nuclear radiation silicon detector's gold film thickness based on the photocurrent from a light passed through the sputtered metal layer. The surface-barrier detectors of nuclear radiations with a gold front contact are characterized by a high sensitivity to light in the 0.4-1.0 micrometer wavelength band. The relative error of determining the gold film thickness using the method examined here is of the 7% order.