Features of metrological support to scientific experiments

The authors consider the analysis of error sources in the determination of electrophysical parameters for polycrystalline semiconductors together with certain regularities occurring in heterogeneous systems as examined in a typical multifactor experiment. The authors examined the methods of testing the properties of polycrystalline germanium, which involves determining the thermal width of the forbidden band from the temperature dependence of the conductivity under pressure without preliminary heating, which substantially reduces the effects of contact resistances between crystals and does not alter the chemical composition. The results of the main interest relate to the distribution of the random error components, which must be known in summing the particular errors. The results are presented for the systematic and random components of the error in measuring the deformation in the measurement cell in the working pressure range.