Some aspects of interactions between HTSC-films and substrates

Different aspects of the interaction between YBa2Cu2Oy(YBCO) films and (100) ZrO2〈Y〉 (YSZ) substrates have been investigated. It was determined using X-ray diffraction methods that the structural mismatch between the film and the substrate leads to a film deformation throughout its thickness. At the same time a strained layer appears in the substrate, whose thickness is proportional to the film thickness. The surface morphology changes of YBCO films which take place with variation of the growth temperaturetsin the vicinity of the optimum temperature lead to changes of the film grain structure probably connected with nucleation centers. Tl2Ba2CaCu2Oy(TBCCO) films on YSZ substrates were also synthesized. It was found that the dependence of the TBCCO film surface morphology changes with annealing temperature and the dependence of YBCO film surface morphology changes ontsare similar.