Deformation of Stomatal Guard Cell Lips and Microfabricated Artificial Topographies during Appressorium Formation by Uromyces

Terhune, B. T., Bojko, R. J., and Hoch, H. C. 1993. Deformation of stomatal guard cell lips and microfabricated artificial topographies during appressorium formation by Uromyces. Experimental Mycology 17, 70-78. The inductive signal, stomatal guard cell lips or 0.5-μm-high plastic ridges, for appres...

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Veröffentlicht in:Experimental mycology 1993-03, Vol.17 (1), p.70-78
Hauptverfasser: Terhune, B.T., Bojko, R.J., Hoch, H.C.
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Sprache:eng
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Zusammenfassung:Terhune, B. T., Bojko, R. J., and Hoch, H. C. 1993. Deformation of stomatal guard cell lips and microfabricated artificial topographies during appressorium formation by Uromyces. Experimental Mycology 17, 70-78. The inductive signal, stomatal guard cell lips or 0.5-μm-high plastic ridges, for appressorium formation in urediospore germlings of Uromyces appendiculatus was examined for signs of physical deformation during the course of appressorium development. The normally erect stomatal guard cell lips were usually observed prostrate at most stages of appressorium development; and, there were no persistent or significant indentations into the fungal cell that might have been caused by the topographical features. To further evaluate the events that occurred at the lip-appressorium interface in situ, polycarbonate and/or polystyrene ridges (0.5 μm high and 0.25 μm wide), mimicking stomatal guard cell lips of Phaseolus vulgaris, were cast on specifically microfabricated silicon templates. These artificial lips induced appressoria and became deformed approximately 30 min after initial contact by the germ tube apex as recorded and observed with time-lapsed video light microscopy. The collapsed nature of the ridges was further evaluated by both transmission and scanning electron microscopy. These results suggest that mechanical forces imposed by a combination of cell turgor pressure and adhesion of the appressorium to the substrate were responsible for deformation of the inductive topography.
ISSN:0147-5975
1878-4399
DOI:10.1006/emyc.1993.1006