Component selection for a compact micro-XRF spectrometer

The performances of a number of commercially available components which together can be employed to assemble a compact micro‐XRF spectrometer were compared. The purpose of such a spectrometer is to permit local, non‐destructive analysis of various materials; its compact nature will allow it to be used on‐site, i.e. at the location where the investigated objects/materials are present rather than in a laboratory. The performances of two polycapillary lenses (of different manufacture) and one monocapillary tube were compared in combination with a mini‐focus x‐ray tube with Mo anode. The use of an Si‐drift chamber and an Si PIN‐diode detector was investigated and the achievable minimum detection limits for trace elements in glass and silver matrices were determined. Finally, the effect of using mini‐focus tubes (with 250 µm focus) as opposed to the use of a more conventional x‐ray source (1 mm focus) on the obtained beam size was investigated. Copyright © 2001 John Wiley & Sons, Ltd.