Relative intensities of different reflection order X-ray lines registered by microprobe analyzers

Relative intensities of X‐ray lines for various reflection orders are measured using a JXA‐8100 microprobe analyzer. Spectra obtained using standard analyzing crystals LiF, PET, TAP, LDE1, and LDE2 are studied. We observe and explain specific features of spectrometers with curved analyzing crystals that influence higher order reflections. The second‐order intensities are similar for different analyzing crystals and lie in the range 2.4 (PET)–5.6% (LiF) of the first‐order intensity. Higher order reflections show more variation. For example, for the LDE2 crystal, no lines of higher than the second‐order were observed, whereas for TAP reflections of up to eighth order were detected. The data obtained may be used for reference purposes. Copyright © 2012 John Wiley & Sons, Ltd.