A peak integration method for acquiring x-ray data for on-line microprobe analysis
The operation of a computer system for producing on‐line chemical analyses from a three‐spectrometer JEOL JXA‐5A electron microprobe is briefly discussed. A new method for acquiring the X‐ray data by integrating the area under the peak is discussed in greater detail. The increased reliability of the...
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| Veröffentlicht in: | X-ray spectrometry 1980-04, Vol.9 (2), p.48-51 |
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| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The operation of a computer system for producing on‐line chemical analyses from a three‐spectrometer JEOL JXA‐5A electron microprobe is briefly discussed. A new method for acquiring the X‐ray data by integrating the area under the peak is discussed in greater detail. The increased reliability of the results from this new method are illustrated by considering the effect of focus error on the measured count rates. |
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| ISSN: | 0049-8246 1097-4539 |
| DOI: | 10.1002/xrs.1300090204 |