Structural Origin of Suppressed Voltage Decay in Single-Crystalline Li-Rich Layered Li[Li 0.2 Ni 0.2 Mn 0.6 ]O 2 Cathodes

Lithium- and manganese-rich layered oxides (LMLOs, ≥ 250 mAh g ) with polycrystalline morphology always suffer from severe voltage decay upon cycling because of the anisotropic lattice strain and oxygen release induced chemo-mechanical breakdown. Herein, a Co-free single-crystalline LMLO, that is, L...

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Veröffentlicht in:Small (Weinheim an der Bergstrasse, Germany) Germany), 2022-06, Vol.18 (25), p.e2201522
Hauptverfasser: Yang, Xiaoxia, Wang, Suning, Han, Duzhao, Wang, Kai, Tayal, Akhil, Baran, Volodymyr, Missyul, Alexander, Fu, Qiang, Song, Jiangxuan, Ehrenberg, Helmut, Indris, Sylvio, Hua, Weibo
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Sprache:eng
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Zusammenfassung:Lithium- and manganese-rich layered oxides (LMLOs, ≥ 250 mAh g ) with polycrystalline morphology always suffer from severe voltage decay upon cycling because of the anisotropic lattice strain and oxygen release induced chemo-mechanical breakdown. Herein, a Co-free single-crystalline LMLO, that is, Li[Li Ni Mn ]O (LLNMO-SC), is prepared via a Li /Na ion-exchange reaction. In situ synchrotron-based X-ray diffraction (sXRD) results demonstrate that relatively small changes in lattice parameters and reduced average micro-strain are observed in LLNMO-SC compared to its polycrystalline counterpart (LLNMO-PC) during the charge-discharge process. Specifically, the as-synthesized LLNMO-SC exhibits a unit cell volume change as low as 1.1% during electrochemical cycling. Such low strain characteristics ensure a stable framework for Li-ion insertion/extraction, which considerably enhances the structural stability of LLNMO during long-term cycling. Due to these peculiar benefits, the average discharge voltage of LLNMO-SC decreases by only ≈0.2 V after 100 cycles at 28 mA g between 2.0 and 4.8 V, which is much lower than that of LLNMO-PC (≈0.5 V). Such a single-crystalline strategy offers a promising solution to constructing stable high-energy lithium-ion batteries (LIBs).
ISSN:1613-6810
1613-6829
DOI:10.1002/smll.202201522