XPS Study of the reduction of cerium dioxide

X‐ray photoelectron spectroscopy of cerium oxides is discussed. The well‐resolved 3d3/2 (5d 6s)0 4f0 2p6 peak at 916.70 eV cannot be used for calculating the amount of reduction because the correlation between its intensity and the concentration of Ce(IV) and CE(III) species is not liner. We have th...

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Veröffentlicht in:	Surface and interface analysis 1993-05, Vol.20 (6), p.508-512
Hauptverfasser:	Romeo, M., Bak, K., El Fallah, J., Le Normand, F., Hilaire, L.
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry Exact sciences and technology Inorganic chemistry and origins of life Kinetics and mechanism of reactions
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Zusammenfassung:	X‐ray photoelectron spectroscopy of cerium oxides is discussed. The well‐resolved 3d3/2 (5d 6s)0 4f0 2p6 peak at 916.70 eV cannot be used for calculating the amount of reduction because the correlation between its intensity and the concentration of Ce(IV) and CE(III) species is not liner. We have therefore develped a complete anlaysis of the whole spectrum. The deconvolution procedure is explained in detail and the method is applied to two examples: a CeO2/Al2O3 sample and a Pd/CeO2 catalyst reduced under hydrogen.
ISSN:	0142-2421 1096-9918
DOI:	10.1002/sia.740200604