Electron spectroscopic investigation of ethylmethylsulfide/nickel interface

Electron spectroscopic investigation of ethylmethylsulfide/nickel interface

To demonstrate the interaction of ethylmethylsulfide (C2H5SCH3) with an Ni(110) surface, we use x‐ray photoelectron spectroscopy and x‐ray absorption near‐edge structure measurements to identify the adsorbed sulfur species and their orientation on the surface at low temperature. The S–C2H5 and S–CH3...

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Veröffentlicht in:Surface and interface analysis 2003-12, Vol.35 (13), p.1050-1054
Hauptverfasser: Syed, J. A., Sardar, S. A., Yagi, S., Tanaka, K.
Format: Artikel
Sprache:eng
Schlagworte:
charge transfer
chemisorption
Chemistry
Exact sciences and technology
General and physical chemistry
orientation
Solid-gas interface
Surface physical chemistry
XANES
XPS
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Zusammenfassung:To demonstrate the interaction of ethylmethylsulfide (C2H5SCH3) with an Ni(110) surface, we use x‐ray photoelectron spectroscopy and x‐ray absorption near‐edge structure measurements to identify the adsorbed sulfur species and their orientation on the surface at low temperature. The S–C2H5 and S–CH3 bonds are found to be oriented at angles of 46 ± 5° and 14 ± 5° from the surface, respectively. A qualitative estimation of charge transfer from substrate to molecule is carried out by S 1s XPS measurements. Copyright © 2003 John Wiley & Sons, Ltd.
ISSN:0142-2421
1096-9918
DOI:10.1002/sia.1627