Atomic force microscopy investigation of cold-plasma-treated poly(ethyleneterephthalate) textiles

Atomic force microscopy (AFM) has been applied to investigate the morphological and topographical surface modifications induced by radiofrequency cold plasma processing of poly(ethyleneterephthalate) textiles. Surface effects are analysed in low‐pressure air plasma for different plasma exposure time...

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Veröffentlicht in:	Surface and interface analysis 2003-04, Vol.35 (4), p.410-412
Hauptverfasser:	Poletti, G., Orsini, F., Riccardi, C., Raffaele-Addamo, A., Barni, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	atomic force microscopy (AFM) Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Physics poly(ethyleneterephthalate) (PET) Polymers, organic compounds Radiation effects on specific materials Solid surfaces and solid-solid interfaces Structure of solids and liquids crystallography Surface structure and topography Surface treatments Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) topographical surface modifications
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Beschreibung
Zusammenfassung:	Atomic force microscopy (AFM) has been applied to investigate the morphological and topographical surface modifications induced by radiofrequency cold plasma processing of poly(ethyleneterephthalate) textiles. Surface effects are analysed in low‐pressure air plasma for different plasma exposure times. The results show a progressive degradation of the surface with increasing roughness. The analysis suggests that modification of the surface during textile treatment may be ascribed to a plasma‐induced physical process. Copyright © 2003 John Wiley & Sons, Ltd.
ISSN:	0142-2421 1096-9918
DOI:	10.1002/sia.1543