Feature-based image reconstruction in three dimensions for electron microscopy Part 2: Image reconstruction

Feature-based image reconstruction in three dimensions for electron microscopy Part 2: Image reconstruction

The three‐dimensional reconstruction of an electron microscopy specimen from a feature‐based representation of the images taken from it is described. The method involves the assembling of the features, their correlation, and the measurement of the disparities between the original images.

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Veröffentlicht in:Scanning 1989, Vol.11 (5), p.223-229
Hauptverfasser: Hood, P. J., Howitt, D. G.
Format: Artikel
Sprache:eng
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Beschreibung
Zusammenfassung:The three‐dimensional reconstruction of an electron microscopy specimen from a feature‐based representation of the images taken from it is described. The method involves the assembling of the features, their correlation, and the measurement of the disparities between the original images.
ISSN:0161-0457
1932-8745
DOI:10.1002/sca.4950110505