Electrodynamic Properties of an Edged High-Temperature Superconducting Film

The structure of the surface barrier and the effect of a transport current on the annihilation of this barrier are investigated for a high‐temperature type‐II superconducting film of arbitrary thickness. It is found that the surface barrier depends on the external field strength, the value of the tr...

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Veröffentlicht in:	Physica status solidi. B. Basic research 1994-08, Vol.184 (2), p.423-431
Hauptverfasser:	Saif, A. G., El-Sabagh, M. A.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Exact sciences and technology High-tc films Physics Properties of type I and type II superconductors Superconducting films and low-dimensional structures Superconductivity Vortex lattices ,flux pinning, flux creep
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Beschreibung
Zusammenfassung:	The structure of the surface barrier and the effect of a transport current on the annihilation of this barrier are investigated for a high‐temperature type‐II superconducting film of arbitrary thickness. It is found that the surface barrier depends on the external field strength, the value of the transport current flowing through the sample, and the orientation of the external field. The results obtained are found in agreement with some previous ones.
ISSN:	0370-1972 1521-3951
DOI:	10.1002/pssb.2221840217