Modified Thomas-Fermi Approximation for Accumulation Layers in MIS Structures

A modified Thomas‐Fermi method for the calculation of the electronic structure of accumulation layers in MIS‐systems is presented which in spite of the simplicity of a “classical” method yields results in good agreement with extensive self‐consistent quantum mechanical calculations. It is shown that...

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Veröffentlicht in:	Physica status solidi. B. Basic research 1988-06, Vol.147 (2), p.823-837
Hauptverfasser:	Übensee, H., Paasch, G., Zöllner, J.-P., Handschack, S.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: electronic structure, electrical, magnetic, and optical properties Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures Exact sciences and technology Physics Surface and interface electron states
Online-Zugang:	Volltext
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