Backside Absorbing Layer Microscopy: Monolayer Counting in 2D Crystal Flakes

In article number 2300068, Dominique Ausserré, Fabien Vialla and co‐workers combine Backside Absorbing Layer Microscopy (BALM) and an original self‐calibrating image analysis procedure to achieve simple, accurate monolayer counting in exfoliated 2D material stacks. The authors demonstrate characterization of flakes from 1 to >30 monolayer thickness with the challenging case of transparent hexagonal boron nitride (hBN).