The Growth and Crystalline Structure of Ultrathin Mn Films on Ni(111)

The growth and crystalline structure of ultrathin Mn films are studied in terms of thickness and temperature by scanning tunneling microscopy (STM) as well as medium‐ and low‐energy electron diffraction. We show that the Mn films deposited at room temperature exhibit a thickness‐dependent growth beh...

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Veröffentlicht in:physica status solidi (b) 2018-09, Vol.255 (9), p.n/a
Hauptverfasser: Song, Jiaming, Kuch, Wolfgang
Format: Artikel
Sprache:eng
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Zusammenfassung:The growth and crystalline structure of ultrathin Mn films are studied in terms of thickness and temperature by scanning tunneling microscopy (STM) as well as medium‐ and low‐energy electron diffraction. We show that the Mn films deposited at room temperature exhibit a thickness‐dependent growth behavior with a layer‐by‐layer growth mode up to 5.3 monolayers. Two transitions in the growth mode can be observed in this range. Atomically resolved STM images of a submonolayer of Mn on Ni(111) reveal a lateral lattice distortion which becomes less significant after the islands form a wetting layer at room temperature. The low‐temperature‐deposited wetting layer shows a metastable lattice distortion which vanishes after annealing to room or higher temperatures. This phenomenon may be attributed to a temperature‐dependent metastable arrangement of the Mn adlayer as well as the distinct interaction strength between Mn–Mn and Mn–Ni atoms. Low‐temperature‐grown thick Mn films exhibit a Stranski–Krastanov growth mode with a stable (3×3)R 30° reconstruction, which remains stable up to room temperature. Scanning‐tunneling‐microscopy and low‐energy‐electron‐diffraction studies of ultrathin Mn films grown on Ni(111) are presented. The Mn wetting layer's crystalline structure exhibits a temperature‐dependent metastable lattice distortion. Transitions in the growth mode at room‐temperature occur at certain thicknesses. The island size influences the crystalline structure of the sub‐monolayer film at room temperature.
ISSN:0370-1972
1521-3951
DOI:10.1002/pssb.201800173