The thickness dependence of the X-ray diffuse scattering intensity for crystals with microdefects at laue-case diffraction

The theory of the dynamical X‐ray diffuse scattering (DS) in single crystals with homogeneously distributed microdefects (point defect clusters, inclusions, new phase nuclei, dislocation loops, etc.) is developed. The thickness dependence of the DS intensity distribution in reciprocal lattice space is investigated by constructing both, iso‐intensity contours and plane projections of three‐dimensional images. Possibilities to obtain a detailed information concerning various‐kind microdefects characteristics by using distribution patterns of the DS intensity are discussed. [Russian Text Ignored].