Molecular images of [M(phthalocyaninato)O]n, where M = Si and Ge: Microphases and structures of crystal domains

This contribution is a study of the crystal structures and crystal domains in the thin epitaxially growing films of [M(Pc)O]n (M = Si and Ge, Pc = phthalocyaninato) revealed by high‐resolution electron microscopy. Microphases detectable only on the microscopic level were observed: (a) γ‐phase for [Si(Pc)O]n, orthorhombic system, a = 1.38 nm, b = 5.52 nm, c = 0.66 nm; and (b) α‐phase for [Ge(Pc)O]n, base‐centered orthorhombic, a = 1.33 nm, b = 2.66 nm, c = 0.35 nm. Translation and rotation crystal domains were visualized on the nanometeric scale. The high‐resolution images are rich in irregularity and provide direct information on the defects and imperfections in the polymer films. © 1995 John Wiley & Sons, Inc.