Durability test of PVP-capped Pt nanoclusters counter electrode for highly efficiency dye-sensitized solar cell
ABSTRACT In this paper, the durability of PVP‐capped Pt nanoclusters counter electrode (PVP‐Pt CE) for dye‐sensitized solar cell (DSSC) has been extensively evaluated including electrochemical reaction durability, thermal stress durability and light soaking durability. It is revealed that PVP‐Pt CE...
Gespeichert in:
Veröffentlicht in: | Progress in photovoltaics 2012-01, Vol.20 (1), p.44-50 |
---|---|
Hauptverfasser: | , , , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | ABSTRACT
In this paper, the durability of PVP‐capped Pt nanoclusters counter electrode (PVP‐Pt CE) for dye‐sensitized solar cell (DSSC) has been extensively evaluated including electrochemical reaction durability, thermal stress durability and light soaking durability. It is revealed that PVP‐Pt CE exhibits both electrochemical and thermal durability by cyclic voltammetry (CV) and electrochemical impedance spectroscopy (EIS) test. Moreover, DSSC containing PVP‐Pt CE shows over 9.37% conversion efficiency in highly volatile electrolyte system. As to device thermal durability, both low‐volatile and non‐volatile electrolyte systems were tested and the results show relative efficiency can maintain more than 85% after accelerated thermal test at 85°C for 1000 h, and 110% after 60°C for 1000 h. Finally, after continuous light soaking test under 60°C for 1000 h, the relative efficiency can still maintain at 94%. Copyright © 2011 John Wiley & Sons, Ltd.
In this paper, the durability of PVP‐Pt CE for DSSC has been extensively evaluated including electrochemical durability (1000 cycle CV scans), thermal stress durability (60 and 85°C for 1000h) and light soaking durability (1 sun irradiation for 1000h under 60°C). |
---|---|
ISSN: | 1062-7995 1099-159X |
DOI: | 10.1002/pip.1107 |