In situ characterization of pin diode waveforms using electro-optic sampling

In situ characterization of pin diode waveforms using electro-optic sampling

In situ measurements of nonlinear waveforms produced by a PIN diode under large‐signal excitation have been performed using ultrafast electro‐optic (EO) sampling.The waveforms were sampled using an EO probe positioned immediately after the diode. These data validate a nonlinear model and improve rep...

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Veröffentlicht in:Microwave and optical technology letters 2012-11, Vol.54 (11), p.2653-2656
Hauptverfasser: Benabe, Evelyn, Crites, Matthew H., Whitaker, John F., Weller, Thomas M.
Format: Artikel
Sprache:eng
Schlagworte:
electro-optic sampling
nonlinear
PIN diode
time-domain
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Zusammenfassung:In situ measurements of nonlinear waveforms produced by a PIN diode under large‐signal excitation have been performed using ultrafast electro‐optic (EO) sampling.The waveforms were sampled using an EO probe positioned immediately after the diode. These data validate a nonlinear model and improve representation of the waveform across the circuit. © 2012 Wiley Periodicals, Inc. Microwave Opt Technol Lett 54:2653–2656, 2012; View this article online at wileyonlinelibrary.com. DOI 10.1002/mop.27119
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.27119