Optimization of Bragg reflectors in AlGaAs/GaAs VCSELs
In this paper a detailed investigation of the distributed Bragg reflectors in GaAs‐based vertical cavity surface emitting lasers is presented. The influence of layer doping concentration, number of periods, oxide aperture and AlxGa1−xAs alloy composition on output emission power and threshold curren...
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Veröffentlicht in: | Laser physics letters 2005-05, Vol.2 (5), p.239-246 |
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Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | In this paper a detailed investigation of the distributed Bragg reflectors in GaAs‐based vertical cavity surface emitting lasers is presented. The influence of layer doping concentration, number of periods, oxide aperture and AlxGa1−xAs alloy composition on output emission power and threshold current has been found. Both oxidized and non oxidized structures have been considered. A number of interpolation curves are extracted and presented for design and fabrication purposes. Although the results are presented for GaAs‐based structures, the theoretical approach is very general. (© 2005 by Astro, Ltd. Published exclusively by WILEY‐VCH Verlag GmbH & Co. KGaA) |
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ISSN: | 1612-2011 1612-202X |
DOI: | 10.1002/lapl.200410179 |