Optimization of GC detector parameters using electronic pressure control

HP 5890 Series II Gas Chromatographs are equipped with prototype hardware enabling electronic pressure programming of all detector and carrier gases. A method of using electronic pressure control (EPC) to optimize detector performance (sensitivity, selectivity, and baseline stability) is demonstrated. With EPC, sample introduction, column separation, and detector performance can be optimized simultaneously without the classical trade‐offs in performance. An example is also presented of the use of a new automated system which enables cool on‐column injection into 250 or 320 μm columns without the need for a retention gap.