X-ray double crystal topographic measurements of distorted crystals

A procedure to measure local variations in lattice distortions based on the shrink and enlarge effect of contours, observed on topographs taken by X‐ray double crystal reflection technique has been proposed and applied in the study of CdTe crystals. A domination of the orientational component of dis...

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Veröffentlicht in:	Crystal research and technology (1979) 1989-12, Vol.24 (12), p.1253-1258
Hauptverfasser:	Trukhanov, E. M., Vassilev, I. S., Botev, P. A., Lyakh, N. V., Sidorov, Yu. G., Stenin, S. I.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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