X-ray double crystal topographic measurements of distorted crystals

A procedure to measure local variations in lattice distortions based on the shrink and enlarge effect of contours, observed on topographs taken by X‐ray double crystal reflection technique has been proposed and applied in the study of CdTe crystals. A domination of the orientational component of distortions has been established, reaching to hundreds of arcsec for points at a distance of 1 cm. The variation in spacings Δd/d does not exceed hundredths of a per cent. [Russian Text Ignored].