X-Ray Topographic Investigation of Dendritic Silicon Crystals

Using Lang and double‐crystal X‐ray topographic methods the dislocation structure of dendritic silicon crystals have been investigated. It is shown that the surface layers of these crystals have a more perfect structure than their bulk volume. The twin lamella is a dislocation‐free formation and there are dislocation‐free zones ∼ 1,5 mm in width in the volume of crystals. [Russian Text Ignored].