On the Second-Order and Orientation Analysis of Planar Stationary Point Processes

The paper presents a method for the second‐order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in comparison to RI...

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Veröffentlicht in:Biometrical journal 1981, Vol.23 (6), p.523-533
Hauptverfasser: Ohser, J., Stoyan, D.
Format: Artikel
Sprache:eng
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Zusammenfassung:The paper presents a method for the second‐order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in comparison to RIPLEY's estimator. Three examples illustrate the use of the statistical techniques.
ISSN:0323-3847
1521-4036
DOI:10.1002/bimj.4710230602