On the Second-Order and Orientation Analysis of Planar Stationary Point Processes
The paper presents a method for the second‐order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in comparison to RI...
Gespeichert in:
Veröffentlicht in: | Biometrical journal 1981, Vol.23 (6), p.523-533 |
---|---|
Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The paper presents a method for the second‐order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in comparison to RIPLEY's estimator. Three examples illustrate the use of the statistical techniques. |
---|---|
ISSN: | 0323-3847 1521-4036 |
DOI: | 10.1002/bimj.4710230602 |