Back Cover: Light‐Induced Dynamic Activation of Copper/Silicon Interface for Highly Selective Carbon Dioxide Reduction (Angew. Chem. Int. Ed. 33/2024)

Back Cover: Light‐Induced Dynamic Activation of Copper/Silicon Interface for Highly Selective Carbon Dioxide Reduction (Angew. Chem. Int. Ed. 33/2024)

Light‐induced dynamic metal nanocrystal/semiconductor interfaces during carbon dioxide electroreduction were investigated by utilizing synchrotron radiation X‐ray absorption spectroscopy, as reported by Hao Ming Chen et al. in their Research Article (e202403333). The dynamic structural transformatio...

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Veröffentlicht in:Angewandte Chemie International Edition 2024-08, Vol.63 (33), p.n/a
Hauptverfasser: Wang, Jiali, Lai, Tai Ying, Lin, Han‐Ting, Kuo, Tsung‐Rong, Chen, Hsiao‐Chien, Tseng, Chun‐Sheng, Tung, Ching‐Wei, Chien, Chia‐Ying, Chen, Hao Ming
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Sprache:eng
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Zusammenfassung:Light‐induced dynamic metal nanocrystal/semiconductor interfaces during carbon dioxide electroreduction were investigated by utilizing synchrotron radiation X‐ray absorption spectroscopy, as reported by Hao Ming Chen et al. in their Research Article (e202403333). The dynamic structural transformations of metal/semiconductor junction under illumination result in an intriguing selectivity switch and realize an improvement of at least 16‐fold in the product ratio of CH4/C2 products.
ISSN:1433-7851
1521-3773
DOI:10.1002/anie.202412574