Self‐Aligning Metallic Vertical Interconnect Access Formation through Microlensing Gas Phase Electrodeposition controlling Airgap and Morphology (Adv. Electron. Mater. 1/2023)
Vertical Interconnects In article number 2200838, Heiko O. Jacobs and co‐workers demonstrate how gas ions and metal particles leave a spark discharge generator in a plasma jet to deposit on a chip in a self‐aligning manner. The charge gas ions float the insulating resist on top of an oxide/metalliza...
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Veröffentlicht in: | Advanced electronic materials 2023-01, Vol.9 (1), p.n/a |
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Hauptverfasser: | , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext bestellen |
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Zusammenfassung: | Vertical Interconnects
In article number 2200838, Heiko O. Jacobs and co‐workers demonstrate how gas ions and metal particles leave a spark discharge generator in a plasma jet to deposit on a chip in a self‐aligning manner. The charge gas ions float the insulating resist on top of an oxide/metallization stack to guide the metal nanoparticles with a surrounding air gap into the interconnect openings to form a contact between the semiconductor and the first metallization level. |
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ISSN: | 2199-160X 2199-160X |
DOI: | 10.1002/aelm.202370005 |