Self‐Aligning Metallic Vertical Interconnect Access Formation through Microlensing Gas Phase Electrodeposition controlling Airgap and Morphology (Adv. Electron. Mater. 1/2023)

Vertical Interconnects In article number 2200838, Heiko O. Jacobs and co‐workers demonstrate how gas ions and metal particles leave a spark discharge generator in a plasma jet to deposit on a chip in a self‐aligning manner. The charge gas ions float the insulating resist on top of an oxide/metalliza...

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Veröffentlicht in:Advanced electronic materials 2023-01, Vol.9 (1), p.n/a
Hauptverfasser: Schlag, Leslie, Isaac, Nishchay A., Hossain, Mohammad M., Hess, Anna‐Lena, Wolz, Benedikt C., Reiprich, Johannes, Ziegler, Mario, Pezoldt, Jörg, Jacobs, Heiko O.
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Sprache:eng
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Zusammenfassung:Vertical Interconnects In article number 2200838, Heiko O. Jacobs and co‐workers demonstrate how gas ions and metal particles leave a spark discharge generator in a plasma jet to deposit on a chip in a self‐aligning manner. The charge gas ions float the insulating resist on top of an oxide/metallization stack to guide the metal nanoparticles with a surrounding air gap into the interconnect openings to form a contact between the semiconductor and the first metallization level.
ISSN:2199-160X
2199-160X
DOI:10.1002/aelm.202370005