Reliability Issues of Thin Film Transistors Subject to Electrostatic Discharge Stresses: An Overview (Adv. Electron. Mater. 2/2022)

Reliability Issues of Thin Film Transistors Subject to Electrostatic Discharge Stresses: An Overview (Adv. Electron. Mater. 2/2022)

Electrostatic Discharge Electrostatic discharge is one of the most prevalent threats to the reliability of electronic components. In article 2100886, Yan Yan, Juin J Liou, and co‐workers provide an overview to summarize the existing articles on the topic of reliability issues of thin film transistor...

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Veröffentlicht in:Advanced electronic materials 2022-02, Vol.8 (2), p.n/a
Hauptverfasser: Yan, Yan, Lan, Wenrui, Chen, Yuankang, Yang, Dongbu, Zhou, Ye, Zhu, Zhihua, Liou, Juin J
Format: Artikel
Sprache:eng
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Zusammenfassung:Electrostatic Discharge Electrostatic discharge is one of the most prevalent threats to the reliability of electronic components. In article 2100886, Yan Yan, Juin J Liou, and co‐workers provide an overview to summarize the existing articles on the topic of reliability issues of thin film transistors in different processes subject to electrostatic discharge stresses and discuss its current status and future research directions.
ISSN:2199-160X
2199-160X
DOI:10.1002/aelm.202270008