Nanoscale Surface Photovoltage Spectroscopy (Advanced Optical Materials 8/2024)
Nanoscale Surface Photovoltage Spectroscopy This cover illustrates the use of Scanning Probe Microscopy based on time‐resolved Kelvin Probe Force Microscopy to measure the nanoscale photoresponse of perovskite solar cell surfaces (see article number 2301318 by Stefan A.L. Weber and co‐workers). This...
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Veröffentlicht in: | Advanced optical materials 2024-03, Vol.12 (8), p.n/a |
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Hauptverfasser: | , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Nanoscale Surface Photovoltage Spectroscopy
This cover illustrates the use of Scanning Probe Microscopy based on time‐resolved Kelvin Probe Force Microscopy to measure the nanoscale photoresponse of perovskite solar cell surfaces (see article number 2301318 by Stefan A.L. Weber and co‐workers). This method, called nanoscale surface photovoltage spectroscopy (nano‐SPV), can resolve and map different areas of different defect density in correlation with the sample topography. The authors' findings demonstrate the influence of passivation and grain size changes on defects. These findings will contribute to a better understanding of defects in perovskite materials. |
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ISSN: | 2195-1071 2195-1071 |
DOI: | 10.1002/adom.202470028 |